Rasterelektronenmikroskop - PR1253394-2790-W

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1 piece Scanning Electron Microscope Scanning Electron Microscopy (SEM) is a widely used analytical method for material analysis that combines non-destructive, user-friendly handling with diverse possibilities for material characterization. In addition to imaging material surfaces, SEM enables the use of various spectroscopic and diffraction-based methods to analyze chemical composition, crystallographic properties, and structural defects. A field emission SEM (FE-SEM) allows access to a wide magnification range reaching into the sub-nanometer resolution range. As a leading institute in the field of materials with (ultra-)wide bandgaps, we require an SEM that supports a broad spectrum of materials science characterization tasks. These include, in particular, the characterization of bulk crystals with (ultra-)wide bandgaps, fine-grained starting materials, untreated substrates concerning intrinsic defects and residual damage (e.g., from polishing processes), substrates with epitaxial layers for (opto-)electronic components, as well as fully processed device wafers. The essential requirements for the planned SEM can be divided into three main aspects: 1) An electron-optical system…

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