Published
SOC-Testsystem - PR1251693-2270-W
Notice number: ocds-mnwr74-231b1571-7efc-4ce9-81e9-1221c6b0d6f0
KEY INFORMATION
- Submission deadline
- • Sep 7, 2026
- Location
- 🇩🇪 Germany
- Contracting authority
- Fraunhofer-Gesellschaft, Einkauf B12
- Accepted Languages
- DEU
- Tender type
- Goods
- Contract Value
- Published date
- Aug 6, 2026
TENDER DESCRIPTION
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.
TENDER BRIEF
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