Published
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
Notice number: 00713490-2026
KEY INFORMATION
- Submission deadline
- • Nov 16, 2026
- Location
- 🇩🇰 Denmark
- Contracting authority
- Danmarks Tekniske Universitet - DTU
- Accepted Languages
- English
- Tender type
- Goods
- Contract Value
- Published date
- Oct 15, 2026
TENDER DESCRIPTION
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
TENDER BRIEF
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DIRECTORY • 2 FILES
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