UPOL/PřF/KEF - Systém FIB-SEM včetně analytických technik a nanoindentace

TENDER DESCRIPTION

The subject of the Public Contract is the supply of a microscopic FIB-SEM system (focused ion beam scanning electron microscope) with the capability to deposit at least three materials (platinum, carbon, tungsten) and associated analytical techniques for detailed analysis of the studied materials (4DSTEM, EBSD, EDS, Nanoindentation, TOF-SIMS). Minimum requirements for the subject of the Public Contract are defined by technical, commercial or other contractual conditions that are annexed to the Tender Documentation. In particular, the Technical Specification and the binding Contract Wording. The subject of the Public Contract is the supply of a microscopic FIB-SEM system (focused ion beam scanning electron microscope) with the capability to deposit at least three materials (platinum, carbon, tungsten) and associated analytical techniques for detailed analysis of the studied materials (4DSTEM, EBSD, EDS, Nanoindentation, TOF-SIMS). Minimum requirements for the subject of the Public Contract are defined by technical, commercial or other contractual conditions that are annexed to the Tender Documentation. In particular, the Technical Specification and the binding Contract Wording.

TENDER BRIEF

TENDER DOCUMENTS